Three-Mode bibliography, Part Y
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|Ya | Yb |
Yc | Yd |
Ye | Yf |
Yg | Yh |
Yi | Yj |
Yk | Yl |
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Yq | Yr |
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Yu | Yv |
Yw | Yx |
Yy | Yz |
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Yakovleva, E., Hopke, P. K., & Wallace, L. (1999).
Receptor modeling assessment of particle total exposure assessment methodology data.
Environmental Science & Technology, 33, 3645-3652.
Abstract PDF
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Yanai, H. (1994).
Tahenryo data kaiseki-ho: Riron to ohyo [Methods of
multivariate data analysis: Theory and applications. Chapter 8:
(pp. 151-159)]. Tokyo: Asakura-shoten.
Abstract
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Yoshino, Y. (1986).
Dimensional subtypes of depression derived by three-mode factor
analysis. Kyushu Neuro-Psychiatry, 32, 245-257.
Abstract
[in Japanese with English abstract].
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Yoshizawa, T. (1975).
Models for quantification techniques in multiple contingency
tables: The theoretical approach. Kodokeiryugaku
[Japanese Journal of Behaviormetrics], 3, 1-11.
Photo
Abstract
[in Japanese with English abstract].
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Yoshizawa, T. (1976).
A generalized definition of interactions and singular value
decomposition of multiway arrays. Kodokeiryugaku (Japanese
Journal of Behaviormetrics), 4, 32-42.
Abstract
[in Japanese with English abstract].
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Yoshizawa, T. (1977).
Structure of multiarray data and population
spaces. Unpublished Ph.D. Thesis, Tokyo University, Tokyo.
[No abstract present.]
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Yoshizawa, T. (1988).
Singular value decomposition of multiarray data and its
applications. In E. Diday, C. Hayashi, M. Jambu, & N. Ohsumi
(Eds.), Recent developments in clustering and data analysis:
Proceedings of the Japanese-French Scientific Seminar, March 24-26,
1987 (pp. 241-257). Boston: Academic Press.
Abstract
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Young, F. W. (1981).
Quantitative analysis of qualitative data.
Psychometrika, 46, 357-388.
Photo
Abstract PDF
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Young, F. W. (1984).
The general Euclidean model. In H. G. Law, C. W. Snyder Jr, J. A. Hattie & R. P. McDonald (Eds.),
Research methods for multimode data analysis (pp. 440-469). New York: Praeger.
Abstract (not yet available)
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Yue, H. H., Qin, S. J., Markle, R. J., Nauert, C., & Gatto, M. (2000).
Fault detection of plasma etchers using optical emission spectra.
IEEE Transactions on Semiconductor Manufacturing, 13, 374-385.
Abstract
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Faculty of Social and Behavioral Sciences |
Three-Mode bibliography |
P. M. Kroonenberg
Faculty of Social and Behavioural Sciences, Leiden University
The Three-Mode Company, Leiden, The Netherlands
E-mail: kroonenb at fsw.leidenuniv.nl
First version & 12/02/1997;